Abstract: Strained solid films are an important component of many semiconductor devices, yet a strained planar layer can be unstable to a morphological instability in which the surface becomes rippled. The instability is driven by the reduction in strain energy which accommodates a rippled surface, with the dynamics set by the rate of diffusional transport along the surface of the film. While our understanding of the stress-driven morphological instability is reasonably well developed for pure materials, our understanding of how it is modified in alloys is less certain. The speaker will present a continuum model for alloy film growth (a free boundary problem in which mass transport occurs by surface diffusion coupled to the state of strain). The stability of alloy film growth in this model will be characterized in terms of some simple limiting cases, highlighting differences in behavior from a pure material and illustrating some novel stability characteristics which occur only for alloys.
| Applied Math Seminar | Weekly Calendar | Department of Mathematical Sciences |
| Dr Richard Braun (e-mail) | Dr Petr Plechac (e-mail) | |
| phone: (302) 831-1869 | phone: (302) 831-2266 |
Last modified 1/30/01