Recovering parameters of a plane stratified dielectric on the perfectly conducting substrate starting from plane wave reflection coefficient
Andriy Synyavskyy

Abstract: An inverse scattering problem for electromagnetic wave normal incidence on a plane stratified dielectric with perfect conducting substrate is considered. The initial data is a frequency dependence of the reflection coefficient, phase characteristic of which enables to extract optical depth of the structure and to formulate two Hilbert-Riemann problems. Solutions of these problems allow to reduce the initial inverse scattering problem to a new one, for pure dielectric medium. Consequently, both thickness and permittivity of layers of this artificially created pure dielectric are recovered from coefficients of scattering matrix, which are given in a form of finite trigonometric series. Approximated methods of solution of the inverse scattering problem are also examined.